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This article introduces methods for constructing prediction bounds or intervals for the number of future failures from heterogeneous reliability field data. We focus on within-sample prediction where early data from a failure-time process is used to predict future failures from the same process. Early data from high-reliability products, however, often have limited information due to some combination of small sample sizes, censoring, and truncation. In such cases, we use a Bayesian hierarchicalarXiv:2011.03140v3 fatcat:o24sf253mbczti4twra6sdwrqq