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Free-Space Materials Characterization by Reflection and Transmission Measurements using Frequency-by-Frequency and Multi-Frequency Algorithms
2018
Electronics
The knowledge of the electromagnetic constitutive properties of materials is crucial in many applications. Free-space methods are widely used for this purpose, despite their inherent practical difficulties. This paper describes an affordable free-space experimental setup for the characterization of flat samples in 1–6 GHz in a non-anechoic environment. The extracted properties are obtained from the calibrated Scattering Parameters, using a frequency-by-frequency solution or a multi-frequency
doi:10.3390/electronics7100260
fatcat:f4u3tczwdzfb5c26wlsihkg4iq