A Pattern Recognition Based Method for IC Failure Analysis

A.J. Strojwas, S.W. Director
1985 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  
for IC failure analysis has The approach is based on statistical pattern recognition concepts and is especially useful for the detection of parametric faults in monolithic ICs. This paper presents a set of algorithms which have been successfully applied to the analysis of the IC failure modes typical of those found in a commercial fabrication process.
doi:10.1109/tcad.1985.1270100 fatcat:tovv7c4fprde3jmf6cnkuzwyia