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Reliability has taken centre stage in the development of high-performance computing processors. A Surge of interest is noticeable in recent times in formulating fault and failure models, understanding failure mechanism and strategizing fault mitigation methods for improving the reliability of the system. The article presents a congregation of concepts illustrated one after the other for a better understanding of damages caused by radiation, relevant fault models, and effects of faults. WearXiv:2203.07830v1 fatcat:dsbx3o4v3femhi5d6kfrurzuoi