Development of generic testing strategies for mixed-signal integrated circuits

T.I. Pritchard, P.S.A. Evans, D. Taylor
1992 IEE Proceedings G Circuits Devices and Systems  
The paper describes work at the Polytechnic of Huddersfield on SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey Semiconductors, Wolfson Microelectronics, and UMIST. The aim of the work is to develop generic testing strategies for mixed-signal (mixed analogue and digital) integrated circuits. The paper proposes a test structure for mixed-signal ICs, and details the development of a test technique and fault model for the analogue circuit cells encountered in
more » ... devices. Results obtained during the evaluation of this technique in simulation are presented, and the ECAD facilities that have contributed to this and other such projects are described. 8
doi:10.1049/ip-g-2.1992.0038 fatcat:ac6strpeibacnf3r27y653c7jm