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Testing Methods for PUF-Based Secure Key Storage Circuits
2014
Journal of electronic testing
Design for test is an integral part of any VLSI chip. However, for secure systems extra precautions have to be taken to prevent that the test circuitry could reveal secret information. This paper addresses secure test for Physical Unclonable Function based systems. It investigates two secure Built-In Self-Test (BIST) solutions for Fuzzy Extractor (FE) which is the main component of PUF-based systems. The schemes target high stuck-at-fault (SAF) coverage by performing scan-chain free functional
doi:10.1007/s10836-014-5471-7
fatcat:nj4fyiiparedhkxbjfwdkuk5ma