Automatically discovering design patterns and assessing concern separations for applications

Giuseppe Pappalardo, Emiliano Tramontana
2006 Proceedings of the 2006 ACM symposium on Applied computing - SAC '06  
doi:10.1145/1141277.1141647 dblp:conf/sac/PappalardoT06 fatcat:tijdakcde5dhbj43rtz27tdyzq