New Application of Carbon Nanotubes. Surface and Thin Film Analysis by Spectroscopic Ellipsometry
分光エリプソメトリによる表面・薄膜の解析

Tomuo YAMAGUCHI
2000 Hyomen Kagaku  
doi:10.1380/jsssj.21.569 fatcat:6axjtgupmjd4vpzsf7kxd63mky