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Transverse Emittance Measurement using Undulator High Harmonics for Diffraction Limited Storage Rings
A particular challenge for diagnostics in diffraction limited storage ring light sources is the measurement of electron beam transverse emittances. In the present work, we present measurements and simulations of vertical electron beam emittance using high harmonics from an electromagnetic undulator in the present Advanced Photon Source storage ring. Based on these results, using simulation we motivate an undulator-based horizontal and vertical transverse emittance monitor for diffractiondoi:10.18429/jacow-ibic2019-thao04 fatcat:tpyick54yzap5ed7xdbjovt6ri