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We report a technique to characterize adhesion of monolayered/multilayered graphene sheets on silicon wafer. Nanoparticles trapped at graphene-silicon interface act as point wedges to support axisymmetric blisters. Local adhesion strength is found by measuring the particle height and blister radius using a scanning electron microscope. Adhesion energy of the typical graphene-silicon interface is measured to be 151Ϯ 28 mJ/ m 2 . The proposed method and our measurements provide insights indoi:10.1063/1.3294960 fatcat:winzrhmfzzdbdd2qn7476gtuvi