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Using noise to break the noise barrier in circuits
Smart Structures, Devices, and Systems II
Technology advances tend to reduce minimum dimensions and source voltages to maintain scaling rules. Both scaling trends make noise more critical, reduce yield and increase device parameter fluctuations. This paper presents an statistical model that permits the study of noise and parameter deviations on gates. Using this model stochastic resonance (SR) is studied both in single devices and arrays for subthreshold and suprathreshold input signals. The SR is measured by the signal-to-noise ratiodoi:10.1117/12.582597 fatcat:po5rk35g2nemjbvm7y4xf7mv5u