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Transmission electron microscopy (TEM) is a powerful tool for analyzing a broad range of materials and provides localized information about the microstructure. However, the analysis results are strongly influenced by the quality of the thin foil specimen. Sample preparation for TEM analysis requires considerable skill, especially when the area of interest is small or the material of interest is diffi cult to thin because of its high hardness and its mechanical instability when thinned. Thisdoi:10.9729/am.2016.46.2.110 fatcat:wlwoxba6ejdapnpr3swnukcybi