A new approach to model nonquasi-static (NQS) effects for mosfets-part II: small-signal analysis

A.S. Roy, J.M. Vasi, M.B. Patil
2003 IEEE Transactions on Electron Devices  
We present a new approach to model nonquasi-static (NQS) effects in a MOSFET in a small-signal situation. The model derived here is based on the large-signal NQS model proposed in [1]. The derivation of the small-signal model is presented. The small-signal parameters obtained with this model prove to be accurate up to very high frequencies. An excellent match between the new model and device simulation results has been observed even when the frequency is many times larger than the cutoff frequency.
doi:10.1109/ted.2003.819054 fatcat:zoewbg5npvcgjcfz6i3az4z2hq