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Emittance measurements of microtron beam
2000
Indian Journal of Pure & Applied Phy sics
unpublished
Preserved Fulltext
Th c transverse heam emittance and twiss parameters o f a 2 1 M eV classica l m icrotron beam hnve heen measured lI sing nondestructive method. The beam profiles were recorded as a function of quadrupol e strengths . A Gaussian curve is fitted in to th e discrete points obtain _d fro m the secondary emission wire monitor. The beam ellipse param e ter~ thu s obt ai ned ha ve heen used for deciding the hemn optics of the tran sfer line which tran sports the beam from the microtron to the synch
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