A Review on Evaluation and Configuration of Fault Injection Attack Instruments to Design Attack Resistant MCU-Based IoT Applications

Zahra Kazemi, David Hely, Mahdi Fazeli, Vincent Beroulle
<span title="2020-07-16">2020</span> <i title="MDPI AG"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/ikdpfme5h5egvnwtvvtjrnntyy" style="color: black;">Electronics</a> </i> &nbsp;
The Internet-of-Things (IoT) has gained significant importance in all aspects of daily life, and there are many areas of application for it. Despite the rate of expansion and the development of infrastructure, such systems also bring new concerns and challenges. Security and privacy are at the top of the list and must be carefully considered by designers and manufacturers. Not only do the devices need to be protected against software and network-based attacks, but proper attention must also be
more &raquo; ... aid to recently emerging hardware-based attacks. However, low-cost unit software developers are not always sufficiently aware of existing vulnerabilities due to these kinds of attacks. To tackle the issue, various platforms are proposed to enable rapid and easy evaluation against physical attacks. Fault attacks are the noticeable type of physical attacks, in which the normal and secure behavior of the targeted devices is liable to be jeopardized. Indeed, such attacks can cause serious malfunctions in the underlying applications. Various studies have been conducted in other research works related to the different aspects of fault injection. Two of the primary means of fault attacks are clock and voltage fault injection. These attacks can be performed with a moderate level of knowledge, utilizing low-cost facilities to target IoT systems. In this paper, we explore the main parameters of the clock and voltage fault generators. This can help hardware security specialists to develop an open-source platform and to evaluate their design against such attacks. The principal concepts of both methods are studied for this purpose. Thereafter, we conclude our paper with the need for such an evaluation platform in the design and production cycle of embedded systems and IoT devices.
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.3390/electronics9071153">doi:10.3390/electronics9071153</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/v7besqcahjgbrbtgndlxglwcuq">fatcat:v7besqcahjgbrbtgndlxglwcuq</a> </span>
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