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In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates atdoi:10.1145/2228360.2228451 dblp:conf/dac/KarakonstantisRBB12 fatcat:p7vy7nxwrngvbi6235ldnsoe4m