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On the exploitation of the inherent error resilience of wireless systems under unreliable silicon
2012
Proceedings of the 49th Annual Design Automation Conference on - DAC '12
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In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at
doi:10.1145/2228360.2228451
dblp:conf/dac/KarakonstantisRBB12
fatcat:p7vy7nxwrngvbi6235ldnsoe4m