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Automated fringe-pattern processing is important in a great number of industrial applications, such as optical data testing and quality control. One of the main problems that arises with these processes is the automated phase unwrapping of the phase map associated with the fringe pattern. Usually the phase map presents problems such as noise, and low-modulation areas. A new phase-unwrapping algorithm with high noise immunity is presented. The algorithm is easily implemented and can processdoi:10.1364/ao.33.006725 pmid:20941216 fatcat:uot5htef7ngpxkhyfrmjn3zfxy