導電性酸化すず薄膜の研究 II 安定な導電性酸化すず薄膜の電気特性
Electrical Behaviours of Stable Conductive Tin Oxide Films

Yoshio TOKUDA
1980 NIPPON KAGAKU KAISHI  
doi:10.1246/nikkashi.1980.809 fatcat:n2pc2xt4areovaedt6zbiickly