INTERNATIONAL JOURNAL OF ADVANCES IN ENGINEERING RESEARCH VERSATILE COMPLEX MARCH TEST PATTERN GENERATION FOR HIGH SPEED FAULT DIAGNOSIS IN FPGA BASED MEMORY BLOCKS

T Prasanth, Mohammad Zubair, A Kurnool, India
International Journal of Advances in Engineering Research International Journal of Advances in Engineering Research   unpublished
The memory blocks testing is a separate testing procedure followed in VLSI testing. The memory blocks testing involves writing a specific bit sequences in the memory locations and reading them again. This type of test is called March test. A particular March test consists of a sequence of writes followed by reads with increasing or decreasing address. For example the March C-test has the following test pattern. There are several test circuits available for testing the memory chips. However no
more » ... st setup is developed so far for testing the memory blocks inside the FPGA. The BRAM blocks of FPGA are designed to work at much higher frequency than the FPGA core logic. Hence testing the BRAMs at higher speed is essential. The conventional memory test circuits cannot be used for this purpose. Hence the proposed work develops a memory testing tool based on March tests for FPGA based BRAM (block RAM testing). The code modules for March test generator shall be developed in VHDL and shall be synthesized for Xilinx Spartan 3 Family device. A PC based GUI tool shall send command to FPGA using serial port for selecting the type of test. The FPGA core gets the command through UART and performs the appropriate and sends the test report back to PC. The results shall be verified in simulation with Xilinx ISE simulator and also in hardware by using Chip scope. Xilinx Spartan 3 family FPGA board shall be used for hardware verification of the developed March test generator.
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