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INTERNATIONAL JOURNAL OF ADVANCES IN ENGINEERING RESEARCH VERSATILE COMPLEX MARCH TEST PATTERN GENERATION FOR HIGH SPEED FAULT DIAGNOSIS IN FPGA BASED MEMORY BLOCKS
International Journal of Advances in Engineering Research International Journal of Advances in Engineering Research
The memory blocks testing is a separate testing procedure followed in VLSI testing. The memory blocks testing involves writing a specific bit sequences in the memory locations and reading them again. This type of test is called March test. A particular March test consists of a sequence of writes followed by reads with increasing or decreasing address. For example the March C-test has the following test pattern. There are several test circuits available for testing the memory chips. However nofatcat:5ayjawsf45gqfbflha5aiyvicu