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Hierarchical porous NiCo2O4 nanowires for high-rate supercapacitors
Prof. Chunzhong Li) Part I: Experimental section The as-prepared products were characterized with X-ray powder diffractometer (XRD; Shimadzu XRD-6000, Cu Kα radiation) at a scan rate of 1 °C min -1 , scanning electron microscopy (FESEM; JEOL, JSM-7600F), and transmission electron microscopy (TEM; JEOL, JEM-2100F) operated at 200 kV. N 2 adsorption/desorption was determined by Brunauer-Emmett-Teller (BET) measurements using a Tristar-3000 surface area analyzer. The electrochemical measurementsdoi:10.1039/c2cc31418e pmid:22453815 fatcat:d4uvxqzi3bgpbftsfcxt4skofi