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RT Level vs. Microarchitecture-Level Reliability Assessment: Case Study on ARM(R) Cortex(R)-A9 CPU
2017
2017 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)
Reliability 1 assessment has always been a major concern in the design of computing systems. The results of the assessment highlight and guide enhancements which trigger redesign cycles; thus early and accurate reliability assessment is of profound importance. For the purposes of early reliability analysis, abstract models of the design (which are available in early design stages) are typically used. These models, however, may not be completely accurate compared to the actual final design.
doi:10.1109/dsn-w.2017.16
dblp:conf/dsn/Chatzidimitriou17
fatcat:zlnjjzwedbb7hdycisjytabamm