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HREM Image Analysis by Fourier Filtering of Reflections with Long Extinction Distances: Application to the Spinel/MgO System
1997
Microscopy Microanalysis Microstructures
PACS.68.35.-p -Solid surfaces and solid-solid interfaces PACS.68.55.-a -Thin film structure and morphology Abstract. 2014 It is known that high resolution electron microscopy can provide quantitative information on the nature of crystalline materials. In the present paper an image processing technique is introduced that profits from long extinction distances in electron diffraction. It is applied to study the real structure of spinel films, which were grown on MgO substrates by solid state
doi:10.1051/mmm:1997108
fatcat:m7lchga3mjgw5is7lnmc6iwekq