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The X-ray Photoelectron Spectroscopy of Surface Films Formed During the ASTM D-130/ISO 2160 Copper Corrosion Test

D. G. Reid, G. C. Smith
2013 Petroleum science and technology  

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The surface chemistry of ISO 2160 copper strips tested in iso-octane with elemental sulphur, aliphatic, cyclic and aromatic thiols, diphenyl sulphide and diphenyl disulphide individually 2 or in combination was studied using XPS. Aliphatic thiols bonded through the sulphur whereas elemental sulphur formed a cuprous sulphide layer. Aromatics bonded partially through the sulphur with the rings oriented horizontally due to  orbital interactions, accounting in part for their inhibitory effects in
more » ... he test. The test rating was not directly related to the sulphur concentration in solution or on the surface, and certain combinations of species resulted in higher levels of sulphur at the surface than found individually.
doi:10.1080/10916466.2011.588635 fatcat:anxmxcg24narvlucfjilsx7ify
Citation

D. G. Reid, G. C. Smith. "The X-ray Photoelectron Spectroscopy of Surface Films Formed During the ASTM D-130/ISO 2160 Copper Corrosion Test." Petroleum science and technology 32.4 (2013) 387-394