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Objectives: A low-transition Test Pattern Generator (TPG) known as Bit Swapping LFSR (BS-LFSR) which generates the test vectors with low transitions. This will increase the correlation and results in one transition between the consecutive test patterns. Methods: The BS-LFSR comprises of an external XOR type LFSR along with multiplexer. The bit swapped test patterns alone is not enough to reduce the average and peak power. The Weighted Transition Metric (WTM) is calculated after shifting of testdoi:10.17485/ijst/2016/v9i38/102135 fatcat:qjgutqnclvedbmgl3cyrafehoy