Coverage evaluation of post-silicon validation tests with virtual prototypes

Kai Cong, Li Lei, Zhenkun Yang, Fei Xie
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014  
High-quality tests for post-silicon validation should be ready before a silicon device becomes available in order to save time spent on preparing, debugging and fixing tests after the device is available. Test coverage is an important metric for evaluating the quality and readiness of post-silicon tests. We propose an online-capture offline-replay approach to coverage evaluation of post-silicon validation tests with virtual prototypes for estimating silicon device test coverage. We first
more » ... necessary data from a concrete execution of the virtual prototype within a virtual platform under a given test, and then compute the test coverage by efficiently replaying this execution offline on the virtual prototype itself. Our approach provides early feedback on quality of post-silicon validation tests before silicon is ready. To ensure fidelity of early coverage evaluation, our approach have been further extended to support coverage evaluation and conformance checking in the post-silicon stage. We have applied our approach to evaluate a suite of common tests on virtual prototypes of five network adapters. Our approach was able to reliably estimate that this suite achieves high functional coverage on all five silicon devices.
doi:10.7873/date.2014.331 dblp:conf/date/CongLYX14 fatcat:jxwwmmt6ujdvbhpi5tdjehsxky