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Proceedings of the conference on Design, automation and test in Europe - DATE '08
Chip reliability becomes a great threat to the design of future microelectronic systems with the continuation of the progressive downscaling of CMOS technologies. Hence increasing the robustness of chip implementations in terms of error tolerance becomes an important issue. In this paper we present a case study in reliability-aware design tolerating transient errors. A state-of-the-art WiMAX channel decoder for LDPC codes is investigated on all design levels to increase its reliability for adoi:10.1145/1403375.1403484 fatcat:lctos32yd5cbfayyc7qmovffua