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Investigation of voltage breakdown caused by microparticles
PACS2001. Proceedings of the 2001 Particle Accelerator Conference (Cat. No.01CH37268)
Degradation of RF accelerating cavities caused by field emission currently limits the design of future linear accelerators. When field emission is the problem, foreign particles often deserve the blame, but they can be "processed" away if the cavity electric field is high enough to initiate voltage breakdown near the particle site, in which case the troublesome particle vaporizes, leaving behind a crater surrounded by a starburst-shaped feature. Severe cratering, however, erodes cavity surfaces
doi:10.1109/pac.2001.986581
fatcat:5qdj2kkglnf6hkqkmdtexul65i