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Characteristics of fault-tolerant photodiode and photogate active pixel sensor (APS)
19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault-tolerant APS has been designed by splitting the APS pixel into two halves operating in parallel, where the photo sensing element has been divided in two and the readout transistors have been duplicated while maintaining a common row select transistor. This split design allows for a self correcting pixel scheme suchdoi:10.1109/dftvs.2004.1347825 fatcat:fokdxv4ilffefmtcq2omyxbzye