Intrinsic uniformity requirements for pinhole SPECT

Alain Seret, Frédéric Bleeser
2006 Journal of Nuclear Medicine Technology  
Although hardly visible on the flood images and only slightly increasing the NEMA differential or integral uniformity, a detector uniformity defect of 3% height is able to generate a visible artifact on the reconstructed transverse slices. The study was conducted on a relatively high-count pinhole SPECT acquisition. Considering that far fewer counts would accumulate in clinical practice, any camera that fulfils these uniformity requirements should not lead to the presence of visible uniformity
more » ... visible uniformity artifacts in the reconstructed slices.
pmid:16517968 fatcat:bpor6ituuvakjni3wseuwm4z5y