Surface X-ray diffraction for graphene grown on SiC (0001) face whose electrical characteristics changed by quenching
急冷により電気特性が変化したSiC(0001)面上成長グラフェンに対する表面X線回折

T. Sumi, K. Nagai, M. Anada, Y. Wakabayashi, J. Bao, T. Terasawa, W. Norimatsu, M. Kusunoki
2018 Meeting Abstracts of the Physical Society of Japan  
doi:10.11316/jpsgaiyo.73.2.0_1993 fatcat:xs6o3hwcpze2dimzxratmnjgwi