Applying ROBDDS for logical circuit delay testing
Использование ROBDD-графов для тестирования задержек логических схем

A.Yu. Matrosova, Tomsk State University (Tomsk, Russian Federation), V.V. Andreeva, V.Z. Tychinskiy, G.G. Goshin, Tomsk State University (Tomsk, Russian Federation), Tomsk State University (Tomsk, Russian Federation), Tomsk State University of Control Systems and Radioelectronics
2019 Izvestiya Vysshikh Uchebnykh Zavedenii. Fizika  
doi:10.17223/00213411/62/5/86 fatcat:6hcw2a5acvh5tnphrhqdjjepju