Internet Archive Scholar

Applying ROBDDS for logical circuit delay testing
Использование ROBDD-графов для тестирования задержек логических схем

A.Yu. Matrosova, Tomsk State University (Tomsk, Russian Federation), V.V. Andreeva, V.Z. Tychinskiy, G.G. Goshin, Tomsk State University (Tomsk, Russian Federation), Tomsk State University (Tomsk, Russian Federation), Tomsk State University of Control Systems and Radioelectronics
2019 Izvestiya Vysshikh Uchebnykh Zavedenii. Fizika  

Preserved Fulltext

fulltext thumbnail
Web Archive Capture PDF (588.9 kB)
https://web.archive.org/web/20200506234307/http://journals.tsu.ru/uploads/import/1854/files/86-94.pdf

A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2020; you can also visit the original URL. The file type is application/pdf.

doi:10.17223/00213411/62/5/86 fatcat:6hcw2a5acvh5tnphrhqdjjepju
Citation

A.Yu. Matrosova, Tomsk State University (Tomsk, Russian Federation), V.V. Andreeva, V.Z. Tychinskiy, G.G. Goshin, Tomsk State University (Tomsk, Russian Federation), Tomsk State University (Tomsk, Russian Federation), Tomsk State University of Control Systems and Radioelectronics. "Applying ROBDDS for logical circuit delay testing." Izvestiya Vysshikh Uchebnykh Zavedenii. Fizika (2019) 86-94