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A Study on the Electrical Properties of MIM Structures Based on Ge2Sb2Te5 and Ge8Sb2Te11 Thin Films for ReRAM
ReRAM응용을 위한 Ge2Sb2Te5와 Ge8Sb2Te11 기반 MIM구조 박막의 전기적 특성 연구

Hwi-Jong Jang, Heon Kong, Jong-Bin Yeo, Hyun-Yong Lee
2017 Journal of the Korean Institute of Electrical and Electronic Material Engineers  

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doi:10.4313/jkem.2017.30.3.144 fatcat:ehghal7uszaenb24xt2giagksy
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Hwi-Jong Jang, Heon Kong, Jong-Bin Yeo, Hyun-Yong Lee. "A Study on the Electrical Properties of MIM Structures Based on Ge2Sb2Te5 and Ge8Sb2Te11 Thin Films for ReRAM." Journal of the Korean Institute of Electrical and Electronic Material Engineers 30.3 (2017) 144-147