A Study on the Electrical Properties of MIM Structures Based on Ge2Sb2Te5 and Ge8Sb2Te11 Thin Films for ReRAM
ReRAM응용을 위한 Ge2Sb2Te5와 Ge8Sb2Te11 기반 MIM구조 박막의 전기적 특성 연구

Hwi-Jong Jang, Heon Kong, Jong-Bin Yeo, Hyun-Yong Lee
2017 Journal of the Korean Institute of Electrical and Electronic Material Engineers  
doi:10.4313/jkem.2017.30.3.144 fatcat:ehghal7uszaenb24xt2giagksy