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There are many applications involving the use of bismuth antimony thin films. However, due to the low crystalline symmetry and the strong coupling between the electronic band edges, it has always been challenging to infer the electronic phase of such a material. Fortunately, with the development of pattern recognition technology, scientists can build many black-box tools for predicting various materials properties. In this work, we have developed several pattern recognition tools to predict thedoi:10.30919/esmm5f661 fatcat:5ied4fvfs5epjexrie2wq3vx5a