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System of Combined Specialized Test Generators for the New Generation of VLIW DSP Processors with Elcore50 Architecture
2019
Problems of advanced micro- and nanoelectronic systems development
In connection with the architectural complexity of modern multi-core structures, more than 60% of the design resources are spent on verification during the development of the processor. Automatic generation of tests is often used to increase test coverage and reduce overall test time. Therefore, the creation of verification test generators to verify the correct operation of microprocessors is becoming increasingly important. This paper describes the technique of development of the several tests
doi:10.31114/2078-7707-2019-2-2-7
fatcat:sde4eheryzeuhfthlmy5pjral4