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Atomic-resolution differential phase contrast electron microscopy
2019
Journal of the Ceramic Society of Japan
Ultra-high spatial resolution better than 0.5 ¡ has been achieved in aberration-corrected scanning transmission electron microscopy (STEM). By combining such an ultra-high resolution STEM with a differential phase contrast (DPC) imaging technique, we can now directly visualize the electric field distribution inside individual atoms in real space. The atomic electric field, i.e., the field between the nucleus of the atom and the electron cloud that surrounds it, contains information about the
doi:10.2109/jcersj2.19118
fatcat:aa3lvezgsrfylkocjmg4ohn244