A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2021; you can also visit the original URL.
The file type is application/pdf
.
A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key
2021
IEEE Access
Scan-based Design for Testability (DFT) is widely used in industry as it consistently provides high fault coverage. However, scan-based DFT is prone to security vulnerabilities where attackers use the scan design to obtain secret information from the system-on-chip. Existing countermeasures for such attacks contribute to enhancing the security of the scan design but cannot prevent the loss of debuggability because scan dumps are also treated as a type of attack even though they provide
doi:10.1109/access.2021.3097348
fatcat:nhducotmbbfy3dtzoqikqehwga