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Electrochemical migration of Sn and Ag in NaCl environment

Balint Medgyes, Daniel Szivos, Sandor Adam, Lajos Tar, Patrik Tamasi, Laszlo Gal, Richard Berenyi, Gabor Harsanyi
2016 2016 IEEE 22nd International Symposium for Design and Technology in Electronic Packaging (SIITME)  

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The impact of chloride ion concentration on electrochemical migration (ECM) of tin and silver was studied by using an in-situ optical and electrical inspection system. It was found, that in both cases, dendrites grow not only in an electrolyte solution at low chloride concentration but also in an electrolyte at medium and high or even saturated chloride concentrations as well. According to the results, the migration susceptibility has decreased at low and medium concentration levels in both
more » ... s. However, the ECM susceptibility of Ag has increased, while the migration susceptibility of Sn was decreased at the saturated concentrations.
doi:10.1109/siitme.2016.7777294 fatcat:bsr5a665pfb2tnlbflmpylegze
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Balint Medgyes, Daniel Szivos, Sandor Adam, Lajos Tar, Patrik Tamasi, Laszlo Gal, Richard Berenyi, Gabor Harsanyi. "Electrochemical migration of Sn and Ag in NaCl environment." 2016 IEEE 22nd International Symposium for Design and Technology in Electronic Packaging (SIITME) (2016)