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Future of low-power chips
2009
IEEE spectrum
Big flaw found in transistor noise theory E ngineers at the U.S. National Institute of Standards and Technology (NIST) say that the basic theory explaining the origin of a certain type of noise produced by very small transistors is totally wrong. Known as random telegraph noise, this aberrant signal is becoming a problem for static RAM and flash memory, and it will also become a threat to future low-power logic circuits as their dimensions continue to shrink and the voltage at which they operate decreases. Without a theory,
doi:10.1109/mspec.2009.5186536
fatcat:n3vwyik3obenjhm6lgoftalbsu