Evaluating the Effectiveness of BEN in Localizing Different Types of Software Fault

Jaganmohan Chandrasekaran, Laleh Sh. Ghandehari, Yu Lei, Raghu Kacker, D. Richard Kuhn
2016 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)  
doi:10.1109/icstw.2016.44 dblp:conf/icst/ChandrasekaranG16 fatcat:em4wxymk6rgirj4a6i64mdx2wy