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We analyzed the degradation features by measuring the capacitance–voltage characteristics after electrically aging blue thermally activated delayed fluorescence (TADF) organic light-emitting diodes (OLEDs). The measurement was investigated in terms of the hole transfer layer (HTL) and electron transfer layer (ETL) structures. For the HTL, three different materials—N,N′–bis(naphthalen–1–yl)–N,N′–bis(phenyl)–benzidine (NPB), 4,4′,4″-tris(carbazol–9–yl)triphenylamine (TCTA), anddoi:10.3390/app122413045 fatcat:ud26mirrpvbprmd2bpx4tmycly