A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is application/pdf
.
The last line effect explained
2016
Empirical Software Engineering
Micro-clones are tiny duplicated pieces of code; they typically comprise only few statements or lines. In this paper, we study the "Last Line Effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 219 open source projects and reporting on 263 faulty micro-clones and interviewing six authors of real-world faulty micro-clones. In an interdisciplinary collaboration, we examine
doi:10.1007/s10664-016-9489-6
fatcat:qunhru4tabfh7lz2adnz4mtv5e