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A Technique to Evaluate MRI-Induced Electric Fields at the Ends of Practical Implanted Lead
IEEE transactions on microwave theory and techniques
This paper presents a novel technique for efficient evaluation of MRI-induced electric fields or induced voltages in the vicinity of implanted metallic leads. The technique is based on the reciprocity theorem in conjunction with the Huygens Principle. This approach allows one to decouple the microscale metallic lead simulation/measurement from the macrolevel phantom human simulations within the MRI scanners. Consequently, the estimation of MRI-induced heating on an implanted lead, and thedoi:10.1109/tmtt.2014.2376523 fatcat:2fi6k2rxgjgvpnpujoa6jirnsa