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Optimized photolithographic fabrication process for carbon nanotube devices
2011
AIP Advances
We have developed a photolithographic process for the fabrication of large arrays of single walled carbon nanotube transistors with high quality electronic properties that rival those of transistors fabricated by electron beam lithography.Abuffer layer is used to prevent direct contact between the nanotube and the novolac-based photoresist, and a cleaning bake at 300C effectively removes residues that bind to the nanotube sidewall during processing. In situ electrical measurement of a nanotube
doi:10.1063/1.3582820
fatcat:tt5mej3tk5g57h6bkh4pdcqewm