Memory less Rotation Based BIST with Low Area Overhead

Drusya J U, S.Prabu Venkateswaran
2014 IOSR Journal of VLSI and Signal processing  
BIST is an efficient method for testing the circuits, area overhead is the main problem associated with BIST. Here we presents a deterministic BIST technique with low area overhead and that can provide complete fault coverage without using any storage devices. The test structure containing a circular shift register with some feedback from the CUT as its input, which provide all the required test patterns. It can provide 100% fault coverage for all testable stuck-at faults.
doi:10.9790/4200-04231217 fatcat:qs2mqp7dsjft5hfiv3qbmnebui