Structure and Optical Properties of CuInSe$lt;inf$gt;2$lt;/inf$gt; and Cu$lt;inf$gt;0.9$lt;/inf$gt;In$lt;inf$gt;0.9$lt;/inf$gt;Zn$lt;inf$gt;0.2$lt;/inf$gt;Se$lt;inf$gt;2$lt;/inf$gt; Thin Films Deposited by One-step Radio-frequency Magnetron Sputtering

WANG Wei-Jun, HE Jun, ZHANG Ke-Zhi, TAO Jia-Hua, SUN Lin, CHEN Ye, YANG Ping-Xiong, CHU Jun-Hao
2014 Journal of Inorganic Materials  
CuInSe 2 (CIS) and Cu 0.9 In 0.9 Zn 0.2 Se 2 (CIZS) thin films were deposited by Radio-Frequency (RF) magnetron sputtering process. X-ray diffraction (XRD) results indicate CIZS film deposited at 300℃ (CIZS-300) is (220) preferred orientation which is different from (112) preferred orientation of other films. Cu-poor and appropriate temperature are major factors for (220) preferred orientation of grains. The Raman spectra show a strong peak around 171 cm -1 and a weak peak around 206 cm -1 ,
more » ... ound 206 cm -1 , which corresponding to A 1 and B 2 modes. Substitution of Zn for Cu leads to a broadening and blue-shift of A 1 Raman mode. The band gap E opt of CIZS film increases due to a reduced Se p-Cu d interband repulsion with Zn doping. Scanning electron microscope (SEM) measurement demonstrates that the surface morphology of CIZS is more compact and smoother than that of CIS thin films.
doi:10.15541/jim20140309 fatcat:pvvn4xbvnbhcvpvbfz7h472gva