A Novel Method for Testing Integrated RF Substrates

Abhilash Goyal, Madhavan Swaminathan, Chirs Ward, George White, Abhijit Chatterjee
2007 2007 Asia-Pacific Microwave Conference  
This paper discusses a novel and a low cost testing technique for integrated radio frequency (RF) substrates with embedded passive filters. This technique is based on resonator and regression analyses and uses low-frequency measurements to predict the filter's insertion loss at high frequency. Moreover, only one-port (Sit) measurement is required for this two-port parameter prediction. Hence; this novel testing technique reduces the cost of test equipments and testing time. To show the
more » ... ty of this proposed methodology both simulation and hardware results are presented for embedded diplexer. The results show that by our proposed methodology, testing frequency can be reduced by approximately 47% for low-pass filter and 33% for high-pass filter of the design frequency. I.
doi:10.1109/apmc.2007.4554562 fatcat:653qojko6vcifbz6wn42z5w5ke