A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is
2007 Asia-Pacific Microwave Conference
This paper discusses a novel and a low cost testing technique for integrated radio frequency (RF) substrates with embedded passive filters. This technique is based on resonator and regression analyses and uses low-frequency measurements to predict the filter's insertion loss at high frequency. Moreover, only one-port (Sit) measurement is required for this two-port parameter prediction. Hence; this novel testing technique reduces the cost of test equipments and testing time. To show thedoi:10.1109/apmc.2007.4554562 fatcat:653qojko6vcifbz6wn42z5w5ke