Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures [chapter]

K. Sokolowski-Tinten, A. Cavalleri, C. W. Siders, F. L. H. Brown, D. M. Leitner, C. Toth, M. Kammler, M. Horn von Hoegen, D. von der Linde, J. A. Squier, C. P. J. Barty, K. R. Wilson
2001 Springer Series in Chemical Physics  
Using time-resolved x-ray diffraction the ultafast strain dynamics in fslaserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed.
doi:10.1007/978-3-642-56546-5_81 fatcat:plz6e33r2nes3dalxoja4icmzu