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Increased NAND flash memory density has come at the cost of lifetime reductions. Flash lifetime can be extended by relaxing internal data retention time, the duration for which a flash cell correctly holds data. Such relaxation cannot be exposed externally to avoid altering the expected data integrity property of a flash device. Reliability mechanisms, most prominently refresh, restore the duration of data integrity, but greatly reduce the lifetime improvements from retention time relaxation bydoi:10.1109/msst.2015.7208284 dblp:conf/mss/LuoCGCM15 fatcat:na5e4bwsb5fabkhvlzns6vvaym