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A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment
2009
2009 Design, Automation & Test in Europe Conference & Exhibition
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test data compression (TDC) schemes and low-power X-filling techniques were proposed to address the above problems. These methods, however, exploit the very same "don't-care" bits in the test cubes to achieve different objectives and hence may contradict to each other. In this work, we propose a generic framework for
doi:10.1109/date.2009.5090899
dblp:conf/date/LiuX09a
fatcat:pckyej2ljjanfih3hmkvsos2pa