A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2022; you can also visit the original URL.
The file type is application/pdf.
PL study of Si:SiO2/SiO2 multilayer film
2021
Journal of Experimental and Theoretical Nanotechnology Specialized Researches (JETNSR)
Preserved Fulltext
The optical properties of 30-layer [nc-Si:SiO2/ SiO2]30 periodic films have been studied. The films were prepared by alternately evaporating SiO and SiO2 onto Si(100) substrates, followed by annealing at 1100 ◦C. Spectroscopic ellipsometry spectrum analysis was used to deter- mine the optical constants of the samples via the Forouhi–Bloomer model. The optical bandgap of a single periodic film is calculated. The photoluminescence (PL) spectra of three samples with different thicknesses clearly
doi:10.56053/5.2.153
fatcat:y2tkcirncnf3vgnfwkze2ed26i